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CTL FOR TEST INFORMATION OF DIGITAL ICS IBD

SPRINGER
04 / 2013
9781475778007
Inglés

Sinopsis

From the reviews: '[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields.' Microelectronics Reliability

PVP
134,41